Multi-Layer Ceramic Capacitor의 Layout 변경을 통한 Electromagnetic Compatibility 필터 신뢰성 개선 연구

Abstract

This study introduces the process of improving the reliability of electromagnetic compatibility filters by changing the layout of Multilayer Ceramic Capacitors (MLCCs). Cracks are the most common type of MLCC failure mechanism. To overcome this, this study proposes a structure that allows the other side of an MLCC to function properly even if one side is short-circuited. To confirm the improvement, Highly Accelerated Life Test(HALT) of MLCC single structure and layout change structure is conducted. Consequently, it is proved that the layout-changed structure decreases short-circuit failures caused by voltage and heat compared to the existing single structure. The results of this study are expected to significantly improve the reliability of EMC filters using MLCCs.