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Call Model and Test-Verification Methods for PS-LTE Core Equipment
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Lee, Jae-Jeong | - |
| dc.contributor.author | Park, Pyung-Koo | - |
| dc.contributor.author | Chung, Byung-Chang | - |
| dc.contributor.author | Kim, Sang-Wan | - |
| dc.contributor.author | Nam, Ki-Dong | - |
| dc.contributor.author | Rhee, Woo-Seop | - |
| dc.date.accessioned | 2022-12-26T10:00:47Z | - |
| dc.date.available | 2022-12-26T10:00:47Z | - |
| dc.date.issued | 2021-10 | - |
| dc.identifier.issn | 2079-9292 | - |
| dc.identifier.issn | 2079-9292 | - |
| dc.identifier.uri | https://scholarworks.gnu.ac.kr/handle/sw.gnu/3236 | - |
| dc.description.abstract | Existing technologies in disaster and safety communication networks (DSCNs) face problems such as narrow bandwidth, low transmission rate, and difficulty in securing channels. Conversely, public safety long-term evolution (PS-LTE) technology provides high-speed, low-latency, quick-setup, and high-security data access for multimedia-based mission-critical services. To perform tests on each unit of core equipment with PS-LTE technology, a new call model such as push-to-talk, which is a service representing PS-LTE, is required. Moreover, objective and consistent metrics and methods are required for administering tests on the unique functions of DSCNs newly constructed with PS-LTE technology. This paper proposes a call model for the core facilities of DSCNs established in Korea, and it also suggests test and verification methods for all the areas of PS-LTE, including mission-critical push-to-talk, evolved multimedia broadcast and multicast service, and coverage and quality assessment for wireless services. | - |
| dc.language | 영어 | - |
| dc.language.iso | ENG | - |
| dc.publisher | MDPI | - |
| dc.title | Call Model and Test-Verification Methods for PS-LTE Core Equipment | - |
| dc.type | Article | - |
| dc.publisher.location | 스위스 | - |
| dc.identifier.doi | 10.3390/electronics10202513 | - |
| dc.identifier.scopusid | 2-s2.0-85117391399 | - |
| dc.identifier.wosid | 000714799200001 | - |
| dc.identifier.bibliographicCitation | ELECTRONICS, v.10, no.20 | - |
| dc.citation.title | ELECTRONICS | - |
| dc.citation.volume | 10 | - |
| dc.citation.number | 20 | - |
| dc.type.docType | Article | - |
| dc.description.isOpenAccess | Y | - |
| dc.description.journalRegisteredClass | scie | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.relation.journalResearchArea | Computer Science | - |
| dc.relation.journalResearchArea | Engineering | - |
| dc.relation.journalResearchArea | Physics | - |
| dc.relation.journalWebOfScienceCategory | Computer Science, Information Systems | - |
| dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
| dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
| dc.subject.keywordPlus | SAFETY | - |
| dc.subject.keywordPlus | NETWORKS | - |
| dc.subject.keywordAuthor | DSCN | - |
| dc.subject.keywordAuthor | PS-LTE | - |
| dc.subject.keywordAuthor | MCPTT | - |
| dc.subject.keywordAuthor | performance test | - |
| dc.subject.keywordAuthor | eMBMS | - |
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