Detailed Information

Cited 1 time in webofscience Cited 1 time in scopus
Metadata Downloads

Structural and electrical properties of K(Ta0.62Nb0.38)O3/BiFeO3 multilayer films for electrocaloric devices

Full metadata record
DC Field Value Language
dc.contributor.authorLim, J.-E.-
dc.contributor.authorLee, M.-G.-
dc.contributor.authorPark, B.-J.-
dc.contributor.authorLee, S.-H.-
dc.contributor.authorPark, J.-S.-
dc.contributor.authorKim, Y.-G.-
dc.contributor.authorLee, S.-G.-
dc.date.accessioned2023-01-04T06:01:01Z-
dc.date.available2023-01-04T06:01:01Z-
dc.date.issued2022-10-
dc.identifier.issn1229-9162-
dc.identifier.issn2672-152X-
dc.identifier.urihttps://scholarworks.gnu.ac.kr/handle/sw.gnu/29953-
dc.description.abstractKTN/BFO multilayer films were manufactured using the spin-coating method on Pt/Ti/SiO2/Si substrate with KTN(62/38) and BFO metal alkoxide solutions. The mean thickness of the multilayer films was about 420-450 nm. A rough interfacial layer was observed at the interface between the lower substrate and the film when sintered at 650oC. Dense microstructures without pores inside of the films were shown via TEM analysis, and an interface between the KTN and BFO layers was clearly observed. The Curie temperature was about 16oC. Dielectric constant and dielectric loss were 1380 and 0.384 at 20oC, respectively. Coercive field of the 2-layer and 6-layer films were 72.6 and 80.4 kV/cm at room temperature, respectively. ΔT and EC coefficient of the 6-layer films sintered at 630oC were 1.96oC and 0.13×10-6 oCmV-1, respectively. © 2022, Hanyang University. All rights reserved.-
dc.format.extent6-
dc.language영어-
dc.language.isoENG-
dc.publisherHanyang University-
dc.titleStructural and electrical properties of K(Ta0.62Nb0.38)O3/BiFeO3 multilayer films for electrocaloric devices-
dc.typeArticle-
dc.publisher.location대한민국-
dc.identifier.doi10.36410/jcpr.2022.23.5.583-
dc.identifier.scopusid2-s2.0-85140966027-
dc.identifier.wosid000896840800004-
dc.identifier.bibliographicCitationJournal of Ceramic Processing Research, v.23, no.5, pp 583 - 588-
dc.citation.titleJournal of Ceramic Processing Research-
dc.citation.volume23-
dc.citation.number5-
dc.citation.startPage583-
dc.citation.endPage588-
dc.type.docTypeArticle-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.description.journalRegisteredClasskci-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalWebOfScienceCategoryMaterials Science, Ceramics-
dc.subject.keywordAuthorBFO-
dc.subject.keywordAuthorElectrocaloric effect-
dc.subject.keywordAuthorKTN-
dc.subject.keywordAuthorMultilayer films-
dc.subject.keywordAuthorSol-gel method-
Files in This Item
There are no files associated with this item.
Appears in
Collections
공학계열 > Dept.of Materials Engineering and Convergence Technology > Journal Articles

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher Lee, Sung Gap photo

Lee, Sung Gap
대학원 (나노신소재융합공학과)
Read more

Altmetrics

Total Views & Downloads

BROWSE