Cited 11 time in
Synthesis and Characterization of Naphthalene End-Capped Divinylbenzene for OTFT
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Park, Sung Jin | - |
| dc.contributor.author | Kim, Sul Ong | - |
| dc.contributor.author | Jung, Sung Ouk | - |
| dc.contributor.author | Yi, Mi-Hye | - |
| dc.contributor.author | Kim, Yun-Hi | - |
| dc.contributor.author | Kwon, Soon-Ki | - |
| dc.date.accessioned | 2022-12-27T05:08:26Z | - |
| dc.date.available | 2022-12-27T05:08:26Z | - |
| dc.date.issued | 2009-09 | - |
| dc.identifier.issn | 0361-5235 | - |
| dc.identifier.issn | 1543-186X | - |
| dc.identifier.uri | https://scholarworks.gnu.ac.kr/handle/sw.gnu/26194 | - |
| dc.description.abstract | An organic field-effect transistor was fabricated based on a thin film of 1,4-bis-(2-naphthalen-2-ylvinyl)benzene (BNDV). The organic semiconductor was deposited via thermal evaporation on a chemically modified silicon dioxide surface. The thermal, optical, electronic, and surface properties of the BNDV compound were investigated by thermogravimetric analysis, differential scanning calorimetry, ultraviolet-visible (UV-vis) absorption, photoluminescence spectroscopies, cyclic voltammetry, x-ray diffraction, and atomic force microscopy. The BNDV had good oxidation stability and exhibited a field-effect performance with a mobility of 0.062 cm(2)/V s, a subthreshold slope of 0.4 V, and an on/off ratio of 2.45 x 10(5). | - |
| dc.format.extent | 6 | - |
| dc.language | 영어 | - |
| dc.language.iso | ENG | - |
| dc.publisher | Institute of Electrical and Electronics Engineers | - |
| dc.title | Synthesis and Characterization of Naphthalene End-Capped Divinylbenzene for OTFT | - |
| dc.type | Article | - |
| dc.publisher.location | 미국 | - |
| dc.identifier.doi | 10.1007/s11664-009-0830-3 | - |
| dc.identifier.scopusid | 2-s2.0-68949157060 | - |
| dc.identifier.wosid | 000268879800026 | - |
| dc.identifier.bibliographicCitation | Journal of Electronic Materials, v.38, no.9, pp 2000 - 2005 | - |
| dc.citation.title | Journal of Electronic Materials | - |
| dc.citation.volume | 38 | - |
| dc.citation.number | 9 | - |
| dc.citation.startPage | 2000 | - |
| dc.citation.endPage | 2005 | - |
| dc.type.docType | Article | - |
| dc.description.isOpenAccess | N | - |
| dc.description.journalRegisteredClass | scie | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.relation.journalResearchArea | Engineering | - |
| dc.relation.journalResearchArea | Materials Science | - |
| dc.relation.journalResearchArea | Physics | - |
| dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
| dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
| dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
| dc.subject.keywordPlus | THIN-FILM TRANSISTORS | - |
| dc.subject.keywordPlus | FIELD-EFFECT TRANSISTORS | - |
| dc.subject.keywordPlus | HIGH-MOBILITY | - |
| dc.subject.keywordPlus | HIGH-PERFORMANCE | - |
| dc.subject.keywordPlus | SEMICONDUCTORS | - |
| dc.subject.keywordPlus | DERIVATIVES | - |
| dc.subject.keywordPlus | DEVICES | - |
| dc.subject.keywordAuthor | Field-effect transistor | - |
| dc.subject.keywordAuthor | semiconductor | - |
| dc.subject.keywordAuthor | oxidation stability | - |
| dc.subject.keywordAuthor | mobility | - |
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.
Gyeongsang National University Central Library, 501, Jinju-daero, Jinju-si, Gyeongsangnam-do, 52828, Republic of Korea+82-55-772-0534
COPYRIGHT 2022 GYEONGSANG NATIONAL UNIVERSITY LIBRARY. ALL RIGHTS RESERVED.
Certain data included herein are derived from the © Web of Science of Clarivate Analytics. All rights reserved.
You may not copy or re-distribute this material in whole or in part without the prior written consent of Clarivate Analytics.
