Cited 8 time in
Mechanical stability of Si thin film deposited on a Ti-50.3Ni(at%) alloy
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kim, Bo-min | - |
| dc.contributor.author | Cho, Gyu-bong | - |
| dc.contributor.author | Noh, Jung-pil | - |
| dc.contributor.author | Ahn, Hyo-jun | - |
| dc.contributor.author | Choi, Eun-soo | - |
| dc.contributor.author | Miyazaki, Shuichi | - |
| dc.contributor.author | Nam, Tae-hyun | - |
| dc.date.accessioned | 2022-12-27T04:16:40Z | - |
| dc.date.available | 2022-12-27T04:16:40Z | - |
| dc.date.issued | 2010-05-14 | - |
| dc.identifier.issn | 0925-8388 | - |
| dc.identifier.issn | 1873-4669 | - |
| dc.identifier.uri | https://scholarworks.gnu.ac.kr/handle/sw.gnu/25098 | - |
| dc.description.abstract | Silicon thin film annealed at 973 K for 7 2 ks after being deposited on a Ti-50.3Ni(at%) substrate was not detached from the substrate after 2 2% tensile deformation, which was ascribed to a diffusion bonding between the Si film and substrate. The B2-B19' transformation start temperature (M(s)) of the Ti-Ni substrate with Si thin film increased by annealing, which was ascribed to a tensile stress developed by the difference in thermal expansion coefficient between the Si film and substrate (C) 2010 Elsevier B.V. All rights reserved | - |
| dc.language | 영어 | - |
| dc.language.iso | ENG | - |
| dc.publisher | ELSEVIER SCIENCE SA | - |
| dc.title | Mechanical stability of Si thin film deposited on a Ti-50.3Ni(at%) alloy | - |
| dc.type | Article | - |
| dc.publisher.location | 스위스 | - |
| dc.identifier.doi | 10.1016/j.jallcom.2010.03.023 | - |
| dc.identifier.scopusid | 2-s2.0-77951091291 | - |
| dc.identifier.wosid | 000278744600004 | - |
| dc.identifier.bibliographicCitation | JOURNAL OF ALLOYS AND COMPOUNDS, v.497, no.1-2, pp L13 - L16 | - |
| dc.citation.title | JOURNAL OF ALLOYS AND COMPOUNDS | - |
| dc.citation.volume | 497 | - |
| dc.citation.number | 1-2 | - |
| dc.citation.startPage | L13 | - |
| dc.citation.endPage | L16 | - |
| dc.type.docType | Article | - |
| dc.description.isOpenAccess | N | - |
| dc.description.journalRegisteredClass | sci | - |
| dc.description.journalRegisteredClass | scie | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.relation.journalResearchArea | Chemistry | - |
| dc.relation.journalResearchArea | Materials Science | - |
| dc.relation.journalResearchArea | Metallurgy & Metallurgical Engineering | - |
| dc.relation.journalWebOfScienceCategory | Chemistry, Physical | - |
| dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
| dc.relation.journalWebOfScienceCategory | Metallurgy & Metallurgical Engineering | - |
| dc.subject.keywordPlus | LI-ION BATTERIES | - |
| dc.subject.keywordPlus | NI | - |
| dc.subject.keywordPlus | SILICON | - |
| dc.subject.keywordPlus | ANODE | - |
| dc.subject.keywordPlus | TRANSFORMATION | - |
| dc.subject.keywordPlus | ELECTRODE | - |
| dc.subject.keywordPlus | SYSTEM | - |
| dc.subject.keywordAuthor | Shape memory alloys (SMA) | - |
| dc.subject.keywordAuthor | Coating | - |
| dc.subject.keywordAuthor | Silicon thin film | - |
| dc.subject.keywordAuthor | Tension test | - |
| dc.subject.keywordAuthor | Martensitic phase transformation | - |
| dc.subject.keywordAuthor | Anode | - |
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