Detailed Information

Cited 7 time in webofscience Cited 8 time in scopus
Metadata Downloads

Mechanical stability of Si thin film deposited on a Ti-50.3Ni(at%) alloy

Full metadata record
DC Field Value Language
dc.contributor.authorKim, Bo-min-
dc.contributor.authorCho, Gyu-bong-
dc.contributor.authorNoh, Jung-pil-
dc.contributor.authorAhn, Hyo-jun-
dc.contributor.authorChoi, Eun-soo-
dc.contributor.authorMiyazaki, Shuichi-
dc.contributor.authorNam, Tae-hyun-
dc.date.accessioned2022-12-27T04:16:40Z-
dc.date.available2022-12-27T04:16:40Z-
dc.date.issued2010-05-14-
dc.identifier.issn0925-8388-
dc.identifier.issn1873-4669-
dc.identifier.urihttps://scholarworks.gnu.ac.kr/handle/sw.gnu/25098-
dc.description.abstractSilicon thin film annealed at 973 K for 7 2 ks after being deposited on a Ti-50.3Ni(at%) substrate was not detached from the substrate after 2 2% tensile deformation, which was ascribed to a diffusion bonding between the Si film and substrate. The B2-B19' transformation start temperature (M(s)) of the Ti-Ni substrate with Si thin film increased by annealing, which was ascribed to a tensile stress developed by the difference in thermal expansion coefficient between the Si film and substrate (C) 2010 Elsevier B.V. All rights reserved-
dc.language영어-
dc.language.isoENG-
dc.publisherELSEVIER SCIENCE SA-
dc.titleMechanical stability of Si thin film deposited on a Ti-50.3Ni(at%) alloy-
dc.typeArticle-
dc.publisher.location스위스-
dc.identifier.doi10.1016/j.jallcom.2010.03.023-
dc.identifier.scopusid2-s2.0-77951091291-
dc.identifier.wosid000278744600004-
dc.identifier.bibliographicCitationJOURNAL OF ALLOYS AND COMPOUNDS, v.497, no.1-2, pp L13 - L16-
dc.citation.titleJOURNAL OF ALLOYS AND COMPOUNDS-
dc.citation.volume497-
dc.citation.number1-2-
dc.citation.startPageL13-
dc.citation.endPageL16-
dc.type.docTypeArticle-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClasssci-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaChemistry-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalResearchAreaMetallurgy & Metallurgical Engineering-
dc.relation.journalWebOfScienceCategoryChemistry, Physical-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryMetallurgy & Metallurgical Engineering-
dc.subject.keywordPlusLI-ION BATTERIES-
dc.subject.keywordPlusNI-
dc.subject.keywordPlusSILICON-
dc.subject.keywordPlusANODE-
dc.subject.keywordPlusTRANSFORMATION-
dc.subject.keywordPlusELECTRODE-
dc.subject.keywordPlusSYSTEM-
dc.subject.keywordAuthorShape memory alloys (SMA)-
dc.subject.keywordAuthorCoating-
dc.subject.keywordAuthorSilicon thin film-
dc.subject.keywordAuthorTension test-
dc.subject.keywordAuthorMartensitic phase transformation-
dc.subject.keywordAuthorAnode-
Files in This Item
There are no files associated with this item.
Appears in
Collections
공학계열 > Dept.of Materials Engineering and Convergence Technology > Journal Articles

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher Ahn, Hyo Jun photo

Ahn, Hyo Jun
대학원 (나노신소재융합공학과)
Read more

Altmetrics

Total Views & Downloads

BROWSE