Cited 25 time in
High-performance organic charge trap flash memory devices based on ink-jet printed 6,13-bis(triisopropylsilylethynyl) pentacene transistors
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Park, Young-Su | - |
| dc.contributor.author | Chung, Seungjun | - |
| dc.contributor.author | Kim, Soo-Jin | - |
| dc.contributor.author | Lyu, Si-Hoon | - |
| dc.contributor.author | Jang, Jae-Wan | - |
| dc.contributor.author | Kwon, Soon-Ki | - |
| dc.contributor.author | Hong, Yongtaek | - |
| dc.contributor.author | Lee, Jang-Sik | - |
| dc.date.accessioned | 2022-12-27T04:10:47Z | - |
| dc.date.available | 2022-12-27T04:10:47Z | - |
| dc.date.issued | 2010-05-24 | - |
| dc.identifier.issn | 0003-6951 | - |
| dc.identifier.issn | 1077-3118 | - |
| dc.identifier.uri | https://scholarworks.gnu.ac.kr/handle/sw.gnu/25095 | - |
| dc.description.abstract | Organic nanofloating gate memory devices were developed based on ink-jet printed 6,13-bis(triisopropylsilylethynyl) (TIPS) pentacene thin-film transistors (TFTs) embedding gold nanoparticles. The programming/erasing operations showed that the organic memory devices exhibited good programmable memory characteristics that resulted in a gate-voltage controlled reliable threshold voltage shift of the programmed/erased states. The data retention and endurance measurements also showed the reliable nonvolatile memory properties. Solution processes were used for synthesis of the charge trapping elements and TIPS-pentacene TFTs were made by the ink-jet printing technique at low temperatures. Therefore, these processes can readily be adopted in all-printed organic memory devices on flexible substrates. (C) 2010 American Institute of Physics. [doi: 10.1063/1.3435470] | - |
| dc.language | 영어 | - |
| dc.language.iso | ENG | - |
| dc.publisher | AMER INST PHYSICS | - |
| dc.title | High-performance organic charge trap flash memory devices based on ink-jet printed 6,13-bis(triisopropylsilylethynyl) pentacene transistors | - |
| dc.type | Article | - |
| dc.publisher.location | 미국 | - |
| dc.identifier.doi | 10.1063/1.3435470 | - |
| dc.identifier.scopusid | 2-s2.0-77956254649 | - |
| dc.identifier.wosid | 000278183200060 | - |
| dc.identifier.bibliographicCitation | APPLIED PHYSICS LETTERS, v.96, no.21 | - |
| dc.citation.title | APPLIED PHYSICS LETTERS | - |
| dc.citation.volume | 96 | - |
| dc.citation.number | 21 | - |
| dc.type.docType | Article | - |
| dc.description.isOpenAccess | N | - |
| dc.description.journalRegisteredClass | sci | - |
| dc.description.journalRegisteredClass | scie | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.relation.journalResearchArea | Physics | - |
| dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
| dc.subject.keywordPlus | THIN-FILM-TRANSISTOR | - |
| dc.subject.keywordPlus | CIRCUITS | - |
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