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Identifying technological opportunities using the novelty detection technique: a case of laser technology in semiconductor manufacturing

Authors
Geum, Y.Jeon, J.Seol, H.
Issue Date
2013
Keywords
data-mining; novelty detection; patent analysis; technology monitoring
Citation
Technology Analysis and Strategic Management, v.25, no.1, pp 1 - 22
Pages
22
Indexed
SSCI
SCOPUS
Journal Title
Technology Analysis and Strategic Management
Volume
25
Number
1
Start Page
1
End Page
22
URI
https://scholarworks.gnu.ac.kr/handle/sw.gnu/21710
DOI
10.1080/09537325.2012.748892
ISSN
0953-7325
Abstract
While identification of technological opportunities has received considerable attention, previous studies have some weaknesses in terms of subjectivity when finding the opportunities in practical terms. This paper proposes a systematic framework to identify technological opportunities, focusing on objective evidences which are specific and practical to be used in a business environment. To do this, we used patents as a source and employed a novelty detection technique whose primary object is detecting the novel pattern. To begin with, the patents are collected from the United States Patent and Trademark Office (USPTO) database. These patents are then pre-processed into a structured keyword vector that can represent the characteristics of each patent. These keyword vectors are then used to analyse the new and emerging pattern, using the novelty detection technique. As the final step, the results are analysed to identify the technological opportunities. A case study on laser technology in lithography is presented to show the proposed framework. ? 2013 Copyright Taylor and Francis Group, LLC.
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공과대학 > Department of Industrial and Systems Engineering > Journal Articles

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공과대학 (산업시스템공학부)
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