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Cited 5 time in webofscience Cited 9 time in scopus
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Blind identification of image manipulation type using mixed statistical moments

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dc.contributor.authorJeong, Bo Gyu-
dc.contributor.authorMoon, Yong Ho-
dc.contributor.authorEom, Il Kyu-
dc.date.accessioned2022-12-26T21:51:00Z-
dc.date.available2022-12-26T21:51:00Z-
dc.date.issued2015-01-
dc.identifier.issn1017-9909-
dc.identifier.issn1560-229X-
dc.identifier.urihttps://scholarworks.gnu.ac.kr/handle/sw.gnu/17501-
dc.description.abstractWe present a blind identification of image manipulation types such as blurring, scaling, sharpening, and histogram equalization. Motivated by the fact that image manipulations can change the frequency characteristics of an image, we introduce three types of feature vectors composed of statistical moments. The proposed statistical moments are generated from separated wavelet histograms, the characteristic functions of the wavelet variance, and the characteristic functions of the spatial image. Our method can solve the n-class classification problem. Through experimental simulations, we demonstrate that our proposed method can achieve high performance in manipulation type detection. The average rate of the correctly identified manipulation types is as high as 99.22%, using 10,800 test images and six manipulation types including the authentic image. (C) 2015 SPIE and IS&T-
dc.language영어-
dc.language.isoENG-
dc.publisherSPIE-SOC PHOTO-OPTICAL INSTRUMENTATION ENGINEERS-
dc.titleBlind identification of image manipulation type using mixed statistical moments-
dc.typeArticle-
dc.publisher.location미국-
dc.identifier.doi10.1117/1.JEI.24.1.013029-
dc.identifier.scopusid2-s2.0-84923333489-
dc.identifier.wosid000350466100030-
dc.identifier.bibliographicCitationJOURNAL OF ELECTRONIC IMAGING, v.24, no.1-
dc.citation.titleJOURNAL OF ELECTRONIC IMAGING-
dc.citation.volume24-
dc.citation.number1-
dc.type.docTypeArticle-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalResearchAreaOptics-
dc.relation.journalResearchAreaImaging Science & Photographic Technology-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.relation.journalWebOfScienceCategoryOptics-
dc.relation.journalWebOfScienceCategoryImaging Science & Photographic Technology-
dc.subject.keywordPlusEXPOSING DIGITAL FORGERIES-
dc.subject.keywordAuthorimage manipulation type-
dc.subject.keywordAuthorblind identification-
dc.subject.keywordAuthorstatistical moments-
dc.subject.keywordAuthorwavelet transform-
dc.subject.keywordAuthorwavelet variance-
dc.subject.keywordAuthorcharacteristic function image forgery detection-
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Moon, Yong Ho
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