Cited 9 time in
Blind identification of image manipulation type using mixed statistical moments
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Jeong, Bo Gyu | - |
| dc.contributor.author | Moon, Yong Ho | - |
| dc.contributor.author | Eom, Il Kyu | - |
| dc.date.accessioned | 2022-12-26T21:51:00Z | - |
| dc.date.available | 2022-12-26T21:51:00Z | - |
| dc.date.issued | 2015-01 | - |
| dc.identifier.issn | 1017-9909 | - |
| dc.identifier.issn | 1560-229X | - |
| dc.identifier.uri | https://scholarworks.gnu.ac.kr/handle/sw.gnu/17501 | - |
| dc.description.abstract | We present a blind identification of image manipulation types such as blurring, scaling, sharpening, and histogram equalization. Motivated by the fact that image manipulations can change the frequency characteristics of an image, we introduce three types of feature vectors composed of statistical moments. The proposed statistical moments are generated from separated wavelet histograms, the characteristic functions of the wavelet variance, and the characteristic functions of the spatial image. Our method can solve the n-class classification problem. Through experimental simulations, we demonstrate that our proposed method can achieve high performance in manipulation type detection. The average rate of the correctly identified manipulation types is as high as 99.22%, using 10,800 test images and six manipulation types including the authentic image. (C) 2015 SPIE and IS&T | - |
| dc.language | 영어 | - |
| dc.language.iso | ENG | - |
| dc.publisher | SPIE-SOC PHOTO-OPTICAL INSTRUMENTATION ENGINEERS | - |
| dc.title | Blind identification of image manipulation type using mixed statistical moments | - |
| dc.type | Article | - |
| dc.publisher.location | 미국 | - |
| dc.identifier.doi | 10.1117/1.JEI.24.1.013029 | - |
| dc.identifier.scopusid | 2-s2.0-84923333489 | - |
| dc.identifier.wosid | 000350466100030 | - |
| dc.identifier.bibliographicCitation | JOURNAL OF ELECTRONIC IMAGING, v.24, no.1 | - |
| dc.citation.title | JOURNAL OF ELECTRONIC IMAGING | - |
| dc.citation.volume | 24 | - |
| dc.citation.number | 1 | - |
| dc.type.docType | Article | - |
| dc.description.isOpenAccess | N | - |
| dc.description.journalRegisteredClass | scie | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.relation.journalResearchArea | Engineering | - |
| dc.relation.journalResearchArea | Optics | - |
| dc.relation.journalResearchArea | Imaging Science & Photographic Technology | - |
| dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
| dc.relation.journalWebOfScienceCategory | Optics | - |
| dc.relation.journalWebOfScienceCategory | Imaging Science & Photographic Technology | - |
| dc.subject.keywordPlus | EXPOSING DIGITAL FORGERIES | - |
| dc.subject.keywordAuthor | image manipulation type | - |
| dc.subject.keywordAuthor | blind identification | - |
| dc.subject.keywordAuthor | statistical moments | - |
| dc.subject.keywordAuthor | wavelet transform | - |
| dc.subject.keywordAuthor | wavelet variance | - |
| dc.subject.keywordAuthor | characteristic function image forgery detection | - |
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