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Si film electrodes containing surface-modified Cu current collectors prepared by a low temperature oxidation-reduction process

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dc.contributor.authorCho, Gyu-Bong-
dc.contributor.authorJeong, Jae-Seung-
dc.contributor.authorIm, Yeon-Min-
dc.contributor.authorChoi, Hyon-Kwang-
dc.contributor.authorNoh, Jung-Pil-
dc.contributor.authorKim, Jae-Kwang-
dc.contributor.authorAhn, Hyo-Jun-
dc.contributor.authorNam, Tae-Hyun-
dc.contributor.authorKim, Ki-Won-
dc.date.accessioned2022-12-26T20:02:34Z-
dc.date.available2022-12-26T20:02:34Z-
dc.date.issued2016-10-
dc.identifier.issn0042-207X-
dc.identifier.urihttps://scholarworks.gnu.ac.kr/handle/sw.gnu/15232-
dc.description.abstractA low-temperature oxidation-reduction process was used to modify the surface of a Cu current collector (foil) for a Si film electrode. The surfaces of the modified Cu foils were investigated under various oxidation-reduction conditions, and the electrochemical properties of Si film electrodes containing the surface modified foils were evaluated. Various nanostructures were found to have formed on the surface; for example, Cu(OH)(2) needles, CuO flowers, and CuO plates formed on Cu-foil surfaces oxidized at 313 K for 1, 10, and 30 min, respectively. Furthermore, these nanostructures were transformed to coral-like Cu2O structures after reduction at 673 K. The amount of Cu2O and the surface roughness decreased on increasing reduction time. The Si film electrode containing a Cu foil reduced for 6 h showed the best electrochemical performance (83.5% of the initial efficiency and 74.8% of capacity retention) due to the small amount of Cu2O and the formation of coral-like structures. (C) 2016 Elsevier Ltd. All rights reserved.-
dc.format.extent8-
dc.language영어-
dc.language.isoENG-
dc.publisherPERGAMON-ELSEVIER SCIENCE LTD-
dc.titleSi film electrodes containing surface-modified Cu current collectors prepared by a low temperature oxidation-reduction process-
dc.typeArticle-
dc.publisher.location영국-
dc.identifier.doi10.1016/j.vacuum.2016.07.020-
dc.identifier.scopusid2-s2.0-84989809053-
dc.identifier.wosid000383299500020-
dc.identifier.bibliographicCitationVACUUM, v.132, pp 130 - 137-
dc.citation.titleVACUUM-
dc.citation.volume132-
dc.citation.startPage130-
dc.citation.endPage137-
dc.type.docTypeArticle-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClasssci-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.subject.keywordPlusLI-ION BATTERIES-
dc.subject.keywordPlusELECTROCHEMICAL PROPERTIES-
dc.subject.keywordPlusAMORPHOUS-SILICON-
dc.subject.keywordPlusANODES-
dc.subject.keywordPlusNANOSTRUCTURES-
dc.subject.keywordPlusPERFORMANCE-
dc.subject.keywordPlusNANOWIRES-
dc.subject.keywordPlusCAPACITY-
dc.subject.keywordPlusPAPER-
dc.subject.keywordPlusNI-
dc.subject.keywordAuthorThin film battery-
dc.subject.keywordAuthorCurrent collector-
dc.subject.keywordAuthorAnode-
dc.subject.keywordAuthorOxidation-
dc.subject.keywordAuthorReduction-
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