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Cited 5 time in webofscience Cited 6 time in scopus
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A low knee voltage and high breakdown voltage of 4H-SiC TSBS employing poly-Si/Ni Schottky scheme

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dc.contributor.authorKim, Dong Young-
dc.contributor.authorSeok, Ogyun-
dc.contributor.authorPark, Himchan-
dc.contributor.authorBahng, Wook-
dc.contributor.authorKim, Hyoung Woo-
dc.contributor.authorPark, Ki Cheol-
dc.date.accessioned2022-12-26T17:17:14Z-
dc.date.available2022-12-26T17:17:14Z-
dc.date.issued2018-02-
dc.identifier.issn0038-1101-
dc.identifier.issn1879-2405-
dc.identifier.urihttps://scholarworks.gnu.ac.kr/handle/sw.gnu/11952-
dc.description.abstractWe report a low knee voltage and high breakdown voltage 4H-SiC TSBS employing poly-Si/Ni dual Schottky contacts. A knee voltage was significantly improved from 0.75 to 0.48 V by utilizing an alternative low workfunction material of poly-Si as an anode electrode. Also, reverse breakdown voltage was successfully improved from 901 to 1154 V due to a shrunk low-work-function Schottky region by a proposed self-align etching process between poly-Si and SiC. SiC TSBS with poly-Si/Ni dual Schottky scheme is a suitable structure for high-efficiency rectification and high-voltage blocking operation.-
dc.format.extent4-
dc.language영어-
dc.language.isoENG-
dc.publisherPERGAMON-ELSEVIER SCIENCE LTD-
dc.titleA low knee voltage and high breakdown voltage of 4H-SiC TSBS employing poly-Si/Ni Schottky scheme-
dc.typeArticle-
dc.publisher.location영국-
dc.identifier.doi10.1016/j.sse.2017.10.009-
dc.identifier.scopusid2-s2.0-85031687849-
dc.identifier.wosid000425490800003-
dc.identifier.bibliographicCitationSOLID-STATE ELECTRONICS, v.140, pp 8 - 11-
dc.citation.titleSOLID-STATE ELECTRONICS-
dc.citation.volume140-
dc.citation.startPage8-
dc.citation.endPage11-
dc.type.docTypeArticle; Proceedings Paper-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClasssci-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.relation.journalWebOfScienceCategoryPhysics, Condensed Matter-
dc.subject.keywordPlusDIODES-
dc.subject.keywordAuthorSiC-
dc.subject.keywordAuthorTrench-
dc.subject.keywordAuthorSchottky-
dc.subject.keywordAuthorSBD-
dc.subject.keywordAuthorTSBS-
dc.subject.keywordAuthorPoly-Si-
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