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Analyzing the Storage Defects From the Perspective of Synthetic Fault Injection

Yoo, Balgeun; Lee, Seongjin; Won, Youjip

ArticleIssue Date2018CitationJournal of Information Science and Engineering, v.34, no.1, pp 1 - 20PublisherInstitute of Information Science
SCIESCOPUS
Power Consumption Signature: Characterizing an SSD

Yoo, Balgeun; Lee, Seongjin; Won, Youjip

ArticleIssue Date2016CitationIEICE Transactions on Information and Systems, v.E99D, no.7, pp 1796 - 1809PublisherOxford University Press
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