Kim, Keun-Mok; Choi, Kyung-Sik; Jung, Hyunki; Yun, Byeonghun; Xu, Jinglong; Ko, Jinho; Lee, Sang-Gug
ArticleIssue Date2023CitationIEEE Journal of Solid-State Circuits, v.58, no.6, pp 1667 - 1680PublisherInstitute of Electrical and Electronics Engineers