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Thermal annealing effect on the crack development and the stability of 6,13-bis(triisopropylsilylethynyl)-pentacene field-effect transistors with a solution-processed polymer insulator

Bae, Jin-Hyuk; Park, Jaehoon; Keum, Chang-Min; Kim, Won-Ho; Kim, Min-Hoi; Kim, Seul-Ong; Kwon, Soon Ki; Lee, Sin-Doo

ArticleIssue Date2010CitationORGANIC ELECTRONICS, v.11, no.5, pp 784 - 788PublisherELSEVIER SCIENCE BV
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