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Markov model-based reliability analysis considering the redundancy effect of modular convertersopen access

Jo, Jae-seong; Kim, Sun-pil; Oh, Seok gyu; Kim, Tae-Jin; Kang, Feel-soon; Park, Sung-Jun

ArticleIssue Date2024CitationIEEE Access, v.12, pp 1 - 1PublisherInstitute of Electrical and Electronics Engineers Inc.
SCIESCOPUS
Reliability analysis based on Markov model, economic feasibility, and efficiency comparison for a cascaded H-bridge multilevel inverter capable of generating 27 levelsopen access

Lim, Seong jin; Kim, Sun-pil; Kang, Feel-soon; Song, Sung-Geun

ArticleIssue Date2024CitationIEEE Access, v.12, pp 1 - 1PublisherInstitute of Electrical and Electronics Engineers Inc.
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