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Development for Electrical Fault Detection and Classification Analysis Model based on Machine Learning Algorithms

Kim, Junho; Sim, Sunhwa; Kim, Seokjun; Cho, Seokheon; Han, Changhee

ArticleIssue Date2024Citation2024 IEEE Conference on Technologies for Sustainability, SusTech 2024, pp 50 - 56PublisherInstitute of Electrical and Electronics Engineers Inc.
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