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Interfacial stability Enhancement in Single-Crystal NCM cathodes through electronic structure optimization

Heo, Boseong; Kim, Miseung; Hwang, Chihyun; Kim, Hyunwoo; Pin, Minwook; Na, Beomtak; Lee, Jinbae; Bak, Chul U.; Cheong, Jun Young; Yu, Seung-Ho, et al.

ArticleIssue Date2025CitationMaterials Today, v.90, pp 322 - 333PublisherElsevier BV
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