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Junction Temperature Estimation to Improve Accuracy of SiC MOSFET Lifetime Model Using Diode Forward Voltage Measurement Circuit

Cha, Myeong-Jun; Min, Sung-Soo; Kang, Su-Gwon; Kim, Ki-Hyun; Lee, Gi-Young; Kim, Rae-Young

ArticleIssue Date2025CitationJournal of Electrical Engineering & Technology, v.21, no.1, pp 493 - 505Publisher대한전기학회
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