Goto, M.; Yamamoto, T.; Han, S.Z.; Ahn, J.H.; Kitamura, J.; Kamil, K.; Yakushiji, T.; Masuda, T.; Iwamura, T.; Kim, S.
ArticleIssue Date2018CitationInternational Journal of Computational Methods and Experimental Measurements, v.6, no.4, pp 691 - 702PublisherWit Press