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Growth behavior of fatigue cracks in ultrafine grained Cu smooth specimens with a small holeopen access

Goto, M.; Morita, K.; Kitamura, J.; Yamamoto, T.; Baba, M.; Han, S.-Z.; Kim, S.

ArticleIssue Date2015CitationFrattura ed Integrita Strutturale, v.9, no.34, pp 427 - 436PublisherGruppo Italiano Frattura
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