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Image-Based Machine Learning Characterizes Root Nodule in Soybean Exposed to Siliconopen access

Chung, Yong Suk; Lee, Unseok; Heo, Seong; Silva, Renato Rodrigues; Na, Chae-In; Kim, Yoonha

ArticleIssue Date2020CitationFrontiers in Plant Science, v.11PublisherFrontiers Media S.A.
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