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Mapping Quantitative Trait Loci for Yield Potential Traits in Wheat Recombinant Inbred Linesopen access

Kang, Chon-Sik; Mo, Young-Jun; Kim, Kyeong-Min; Kim, Kyeong-Hoon; Chun, Jae-Buhm; Park, Chul-Soo; Cho, Seong-Woo

ArticleIssue Date2021CitationAGRONOMY-BASEL, v.11, no.1PublisherMDPI
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