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Fatigue-induced damage and crack growth of Cu processed by ECAP

Goto, Masahiro; Morita, Kakeru; Kitamura, Jyunichi; Baba, Masataka; Han, Seung-Zeon; Ahn, Jee-Hyuk; Kim, Sangshik

ArticleIssue Date2015CitationMODERN PHYSICS LETTERS B, v.29, no.6-7PublisherWORLD SCIENTIFIC PUBL CO PTE LTD
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